Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, John Davis, Steven Swanson
IEEE Globecomm 2010 Workshop on Application of Communciation Theory to Emerging Memory Technologies (ACTEMT) | December 2010
Srinidhi Kestur, John Davis, Oliver Williams
IEEE Computer Society Symposium on VLSI | July 2010
IEEE Computer Society Symposium on VLSI
John Davis, Chuck Thacker, Chen Chang
MSR-TR-2009-45 | April 2009
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
45th Design Automation Conference (DAC) | June 2008
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
International Conference on Theory and Applications of Satisfiability Testing (SAT) | May 2008
International Conference on Theory and Applications of Satisfiability Testing (SAT)
ISBN: 978-3-540-79718-0
Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, John Davis, Steven Swanson
IEEE Globecomm 2010 Workshop on Application of Communciation Theory to Emerging Memory Technologies (ACTEMT) | December 2010
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
International Conference on Theory and Applications of Satisfiability Testing (SAT) | May 2008
International Conference on Theory and Applications of Satisfiability Testing (SAT)
ISBN: 978-3-540-79718-0
Srinidhi Kestur, John Davis, Oliver Williams
IEEE Computer Society Symposium on VLSI | July 2010
IEEE Computer Society Symposium on VLSI
John Davis, Chuck Thacker, Chen Chang
MSR-TR-2009-45 | April 2009
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
45th Design Automation Conference (DAC) | June 2008
Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, John Davis, Steven Swanson
IEEE Globecomm 2010 Workshop on Application of Communciation Theory to Emerging Memory Technologies (ACTEMT) | December 2010
Srinidhi Kestur, John Davis, Oliver Williams
IEEE Computer Society Symposium on VLSI | July 2010
IEEE Computer Society Symposium on VLSI
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
45th Design Automation Conference (DAC) | June 2008
John Davis, Zhangxi Tan, Fang Yu, Lintao Zhang
International Conference on Theory and Applications of Satisfiability Testing (SAT) | May 2008
International Conference on Theory and Applications of Satisfiability Testing (SAT)
ISBN: 978-3-540-79718-0
John Davis, Chuck Thacker, Chen Chang
MSR-TR-2009-45 | April 2009
Emeritus Researcher
