{"id":152804,"date":"2004-11-01T00:00:00","date_gmt":"2004-11-01T00:00:00","guid":{"rendered":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/msr-research-item\/measuring-reliability-of-software-products\/"},"modified":"2018-10-16T20:16:49","modified_gmt":"2018-10-17T03:16:49","slug":"measuring-reliability-of-software-products","status":"publish","type":"msr-research-item","link":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/publication\/measuring-reliability-of-software-products\/","title":{"rendered":"Measuring Reliability of Software Products"},"content":{"rendered":"<div class=\"asset-content\">\n<p>Current methods to measure the reliability of software are usually focused on large server based products. In these approaches, the product reliability is traditionally measured in terms of catastrophic failures, as the failure data is generally collected manually through service organizations which filter out data on many types of operational failures. These method and metrics are not applicable for mass market products that run in multiple operational profiles, where other types of failures might be equally important, and where manual data collection is inadequate. For such products, unique issues arise in obtaining the failure and population data, and in analyzing this data to determine reliability. In this paper we first discuss some of the key issues in determining reliability of such software products, and then discuss two systems being used for measuring reliability of commercial software products.<\/p>\n<\/div>\n<p><!-- .asset-content --><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Current methods to measure the reliability of software are usually focused on large server based products. In these approaches, the product reliability is traditionally measured in terms of catastrophic failures, as the failure data is generally collected manually through service organizations which filter out data on many types of operational failures. These method and metrics [&hellip;]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","msr-author-ordering":null,"msr_publishername":"Institute of Electrical and Electronics Engineers, Inc.","msr_publisher_other":"","msr_booktitle":"","msr_chapter":"","msr_edition":"","msr_editors":"","msr_how_published":"","msr_isbn":"","msr_issue":"","msr_journal":"","msr_number":"MSR-TR-2004-145","msr_organization":"","msr_pages_string":"14","msr_page_range_start":"14","msr_page_range_end":"","msr_series":"","msr_volume":"","msr_copyright":"\u00a9 2004 IEEE. Personal use of this material is permitted. However, permission to reprint\/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.","msr_conference_name":"","msr_doi":"","msr_arxiv_id":"","msr_s2_paper_id":"","msr_mag_id":"","msr_pubmed_id":"","msr_other_authors":"Pankaj Jalote, Mario Garzia, Ben Errez","msr_other_contributors":"","msr_speaker":"","msr_award":"","msr_affiliation":"","msr_institution":"Microsoft Research","msr_host":"","msr_version":"","msr_duration":"","msr_original_fields_of_study":"","msr_release_tracker_id":"","msr_s2_match_type":"","msr_citation_count_updated":"","msr_published_date":"2004-11-01","msr_highlight_text":"","msr_notes":"","msr_longbiography":"","msr_publicationurl":"http:\/\/www.ieee.org\/","msr_external_url":"","msr_secondary_video_url":"","msr_conference_url":"","msr_journal_url":"","msr_s2_pdf_url":"","msr_year":2004,"msr_citation_count":0,"msr_influential_citations":0,"msr_reference_count":0,"msr_s2_match_confidence":0,"msr_microsoftintellectualproperty":true,"msr_s2_open_access":false,"msr_s2_author_ids":[],"msr_pub_ids":[],"msr_hide_image_in_river":0,"footnotes":""},"msr-research-highlight":[],"research-area":[13547],"msr-publication-type":[193718],"msr-publisher":[],"msr-focus-area":[],"msr-locale":[268875],"msr-post-option":[],"msr-field-of-study":[],"msr-conference":[],"msr-journal":[],"msr-impact-theme":[],"msr-pillar":[],"class_list":["post-152804","msr-research-item","type-msr-research-item","status-publish","hentry","msr-research-area-systems-and-networking","msr-locale-en_us"],"msr_publishername":"Institute of Electrical and Electronics Engineers, Inc.","msr_edition":"","msr_affiliation":"","msr_published_date":"2004-11-01","msr_host":"","msr_duration":"","msr_version":"","msr_speaker":"","msr_other_contributors":"","msr_booktitle":"","msr_pages_string":"14","msr_chapter":"","msr_isbn":"","msr_journal":"","msr_volume":"","msr_number":"MSR-TR-2004-145","msr_editors":"","msr_series":"","msr_issue":"","msr_organization":"","msr_how_published":"","msr_notes":"","msr_highlight_text":"","msr_release_tracker_id":"","msr_original_fields_of_study":"","msr_download_urls":"","msr_external_url":"","msr_secondary_video_url":"","msr_longbiography":"","msr_microsoftintellectualproperty":1,"msr_main_download":"209769","msr_publicationurl":"http:\/\/www.ieee.org\/","msr_doi":"","msr_publication_uploader":[{"type":"file","title":"tr-2004-145.pdf","viewUrl":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-content\/uploads\/2016\/02\/tr-2004-145.pdf","id":209769,"label_id":0},{"type":"url","title":"http:\/\/www.ieee.org\/","viewUrl":false,"id":false,"label_id":0}],"msr_related_uploader":"","msr_citation_count":0,"msr_citation_count_updated":"","msr_s2_paper_id":"","msr_influential_citations":0,"msr_reference_count":0,"msr_arxiv_id":"","msr_s2_author_ids":[],"msr_s2_open_access":false,"msr_s2_pdf_url":null,"msr_attachments":[{"id":0,"url":"http:\/\/www.ieee.org\/"},{"id":209769,"url":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-content\/uploads\/2016\/02\/tr-2004-145.pdf"}],"msr-author-ordering":[{"type":"text","value":"Pankaj Jalote","user_id":0,"rest_url":false},{"type":"user_nicename","value":"bmurphy","user_id":31259,"rest_url":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/microsoft-research\/v1\/researchers?person=bmurphy"},{"type":"text","value":"Mario Garzia","user_id":0,"rest_url":false},{"type":"text","value":"Ben Errez","user_id":0,"rest_url":false}],"msr_impact_theme":[],"msr_research_lab":[],"msr_event":[],"msr_group":[],"msr_project":[],"publication":[],"video":[],"msr-tool":[],"msr_publication_type":"techreport","related_content":[],"_links":{"self":[{"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/152804","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item"}],"about":[{"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/types\/msr-research-item"}],"version-history":[{"count":1,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/152804\/revisions"}],"predecessor-version":[{"id":525023,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/152804\/revisions\/525023"}],"wp:attachment":[{"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/media?parent=152804"}],"wp:term":[{"taxonomy":"msr-research-highlight","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-research-highlight?post=152804"},{"taxonomy":"msr-research-area","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/research-area?post=152804"},{"taxonomy":"msr-publication-type","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-publication-type?post=152804"},{"taxonomy":"msr-publisher","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-publisher?post=152804"},{"taxonomy":"msr-focus-area","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-focus-area?post=152804"},{"taxonomy":"msr-locale","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-locale?post=152804"},{"taxonomy":"msr-post-option","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-post-option?post=152804"},{"taxonomy":"msr-field-of-study","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-field-of-study?post=152804"},{"taxonomy":"msr-conference","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-conference?post=152804"},{"taxonomy":"msr-journal","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-journal?post=152804"},{"taxonomy":"msr-impact-theme","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-impact-theme?post=152804"},{"taxonomy":"msr-pillar","embeddable":true,"href":"https:\/\/new-cm-edgedigital.pages.dev\/en-us\/research\/wp-json\/wp\/v2\/msr-pillar?post=152804"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}